Effects of stabilizing agents on film properties in Ag electroless plating

Journal of the Electrochemical Society

Volumn 155, Issue 3, 2008, Pages

  Koo, Hyo Chol ^a,b   Kim, Jae Jeong ^a,b  

^a Seoul National University   (South Korea)

^b ELECTROCHEMICAL SOCIETY

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTROLESS PLATING; GRAIN BOUNDARIES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ELECTRON TRANSFER; STABILIZING AGENTS;

SILVER;

EID: 38349163924     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2823740     Document Type: Article

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