Physical mechanisms of single-event effects in advanced microelectronics

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 261, Issue 1-2 SPEC. ISS., 2007, Pages 1133-1136

  Schrimpf, Ronald D ^a   Weller, Robert A ^a   Mendenhall, Marcus H ^b   Reed, Robert A ^a   Massengill, Lloyd W ^a  

^a VANDERBILT UNIVERSITY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

Author keywords

GEANT4; Radiation effects; Single event effects; Soft errors

Indexed keywords

NUCLEAR REACTIONS; PHYSICAL MECHANISMS; SEMICONDUCTOR TECHNOLOGIES; SOFT ERRORS;

COMPUTER SIMULATION; IONS; PARTICLE ACCELERATORS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES;

MICROELECTRONICS;

EID: 34447271035     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.04.050     Document Type: Article

References (10)

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