Limiting upset cross sections of SEU hardened SOI SRAMs

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3487-3493

  Liu, Michael S ^a,b   Liu, Harry Y ^b   Brewster, Nancy ^b   Nelson, Dave ^b   Golke, Keith W ^b   Kirchner, Gary ^b   Hughes, Harold L ^a,c   Campbell, Arthur ^a,c   Ziegler, James F ^a,c  

^a IEEE   (United States)

^b HONEYWELL TECHNOLOGY CENTER   (United States)

^c NAVAL RESEARCH LABORATORY   (United States)

Author keywords

SEU; SOI; SRAM; Upset mechanism

Indexed keywords

SUBMICRON; UPSET MECHANISM;

HEAVY IONS; LIMITERS; RADIATION HARDENING; SILICON ON INSULATOR TECHNOLOGY;

STATIC RANDOM ACCESS STORAGE;

EID: 33846318860     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.886216     Document Type: Conference Paper

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