Performance of the high-energy single-event effects test facility (SEETF) at Michigan state university's national superconducting cyclotron laboratory (NSCL)

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 II, 2004, Pages 3664-3668

  Ladbury, Ray ^a   Reed, Robert A ^b,c   Marshall, Paul ^d   LaBel, Kenneth A ^e   Anantaraman, R ^e   Fox, R ^e   Sanderson, D P ^e   Stolz, A ^e   Yurkon, J ^d   Zeller, A F ^d   Stetson, J W ^d  

^a NORTHROP GRUMMAN CORPORATION   (United States)

^b NASA HEADQUARTERS   (United States)

^c VANDERBILT UNIVERSITY   (United States)

^d GSFC ^*

^e MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; ION BEAMS; RADIATION EFFECTS; RESEARCH LABORATORIES; TEST FACILITIES; VACUUM;

ION ENERGY; LINEAR ENERGY TRANSFER (LET); SINGLE-EVENT TESTING; SPACE RADIATION SPECTRUM;

CYCLOTRONS;

EID: 17644408487     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839300     Document Type: Conference Paper

References (7)

1. R. Harboe-Sorensen et al., "Heavy-ion single-event effects testing of lead-on-chip assembled high-density memories," IEEE Trans. Nucl. Sci., vol. 50, pp. 2322-2322, 2003.
2. G. M. Swift, "Single-event testing using heavy-ion irradiation through thick layers of material," in Proc. 6th Eur. Conf. Radiation and Its Effects on Components and Systems, 2001.
3. N. Anantaraman, "NSCL Single Event Effects Test Facility Users Manual," National Superconducting Cyclotron Lab., Michigan State Univ., East Lansing, MI.
4. J. F. Ziegler et al., The Stopping and Range of Ions in Solids. New York: Pergamon, 1984.
5. LISE [Online]. Available: http://groups.nscl.msu.edu/lise/lise.html
6. R. A. Reed et al., "In-situ measurement of the particle linear energy transfer using the sensitive junctions of the device under test," in Proc. 6th Eur. Conf. Radiation and Its Effects on Components and Systems, 2001.
7. J. Titus et al., "See characterization of vertical DMOSFETs: An updated test protocol," IEEE Trans. Nucl. Sci., vol. 50, pp. 2341-2341, 2003.