Comparative SEU sensitivities to relativistic heavy ions

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2475-2482

  Koga, R ^a   Grain, S H ^a   Grain, W R ^a   Crawford, K B ^a   Hansel, S J ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; HEAVY IONS; SEMICONDUCTOR DEVICE TESTING;

ION TRACK STRUCTURES; SINGLE-EVENT UPSET (SEU);

SEMICONDUCTOR JUNCTIONS;

EID: 0032308198     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736488     Document Type: Article

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