Application of focused ion beam to atom probe tomography specimen preparation from mechanically alloyed powders

Microscopy and Microanalysis

Volumn 13, Issue 5, 2007, Pages 347-353

  Choi, Pyuck Pa ^a   Al Kassab, Tala'at ^b   Kwon, Young Soon ^c   Kim, Ji Soon ^c   Kirchheim, Reiner ^b  

^a Korea Institute of Science and Technology   (South Korea)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

^c University of Ulsan   (South Korea)

Author keywords

Atom probe tomography; Focused ion beam; in situ lift out technique; Mechanically alloyed powder; Nanocrystalline materials

Indexed keywords

EID: 34948816115     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927607070717     Document Type: Article

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