A new approach to preparing tips for atom probe field ion microscopy from powder materials

Materials Science and Engineering: A

Volumn 327, Issue 1, 2002, Pages 20-23

  Wu, Fang ^a   Bellon, P ^a   Lau, M L ^b   Lavernia, E J ^b   Lusby, T A ^c   Melmed, A J ^c  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c Johns Hopkins University   (United States)

Author keywords

Atom probe; Ball milling; Cu Ag; Nanocomposites

Indexed keywords

MECHANICAL ALLOYING; PARTICLE SIZE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ATOM PROBE FIELD ION MICROSCOPY; CRYOMILLING;

POWDER METALS;

BALL MILL; COMPOSITE; COPPER ALLOY; POWDER;

EID: 0037089933     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(01)01884-6     Document Type: Article

References (10)