Site-specific transmission electron microscope characterization of micrometer-sized particles using the focused ion beam lift-out technique

Microscopy and Microanalysis

Volumn 7, Issue 5, 2001, Pages 418-423

  Lomness, Janice K ^a   Giannuzzi, Lucille A ^a   Hampton, Michael D ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

Focused ion beam; Micrometer powder particles; Site specific; Transmission electron microscope analysis of micrometer sized particles; Transmission electron microscope specimen preparation; Transmission electron microscopy

Indexed keywords

EID: 0000355331     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927601010418     Document Type: Article

References (15)

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