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Volumn 2, Issue 9, 2007, Pages 442-446

Strain relief analysis of InN quantum dots grown on GaN

Author keywords

High misfit interface; HRTEM; InN; Misfit relaxation; Strain mapping

Indexed keywords

HIGH MISFIT INTERFACES; MISFIT RELAXATION; STRAIN MAPPING;

EID: 34548807151     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1007/s11671-007-9080-6     Document Type: Article
Times cited : (15)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.