Plastic strain relaxation of nitride heterostructures

Journal of Applied Physics

Volumn 95, Issue 3, 2004, Pages 1127-1133

  Bellet Amalric, E ^a   Adelmann, C ^a   Sarigiannidou, E ^a   Rouviere J L ^a   Feuillet, G ^a   Monroy, E ^a   Daudin, B ^a  

^a CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); HETEROJUNCTIONS; INTERFACES (MATERIALS); LATTICE CONSTANTS; METALLORGANIC VAPOR PHASE EPITAXY; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR GROWTH; SURFACES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

HIGH RESOLUTION X-RAY DIFFRACTION; NITRIDE HETEROSTRUCTURES; PLASMA-ASSISTED MOLECULAR BEAM EPITAXY; PLASTIC STRAIN RELAXATION;

RELAXATION PROCESSES;

EID: 1142304510     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1637934     Document Type: Article

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