Proton-induced fixed positive charge at the Si(100)-SiO2 interface

Physical Review Letters

Volumn 99, Issue 12, 2007, Pages

  Godet, Julien ^a   Giustino, Feliciano ^b   Pasquarello, Alfredo ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

^b UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; INTERFACES (MATERIALS); OXIDATION; SILICA;

DEEP DEFECTS; SILICON OXIDATION; STRAINED BONDS;

CHARGED PARTICLES;

EID: 34548714100     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.99.126102     Document Type: Article

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