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Applied Physics Letters

Volumn 77, Issue 19, 2000, Pages 3081-3083

Near interface H+ trapping and its influence on H+ transport in hydrogenated unibond buried oxides

(2) Macfarlane, P J a Stahlbush, R E a

a NAVAL RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001532946 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1323994 Document Type: Article

Times cited : (13)

References (18)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.