Design and DfT of a high-speed area-efficient embedded asynchronous FIFO

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2007, Pages 853-858

  Wielage, Paul ^a   Marinissen, Erik Jan ^a   Altheimer, Michel ^b   Wouters, Clemens ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

^b NXP SEMICONDUCTORS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EMBEDDED SYSTEMS; INTEGRATED CIRCUIT LAYOUT; SYSTEMS ANALYSIS;

DESIGN-FOR-TEST; FIRST-IN FIRST-OUT (FIFO); READ AND WRITE CLOCKS;

STATIC RANDOM ACCESS STORAGE;

EID: 34548314014     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2007.364399     Document Type: Conference Paper

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