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Volumn , Issue , 1999, Pages 294-300
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Practical scan test generation and application for embedded FIFOs
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Author keywords
[No Author keywords available]
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Indexed keywords
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
BUILT-IN SELF TEST;
COMPUTER SIMULATION;
DESIGN FOR TESTABILITY;
DIGITAL STORAGE;
EMBEDDED SYSTEMS;
FINITE AUTOMATA;
FLIP FLOP CIRCUITS;
SHIFT REGISTERS;
FINITE STATE MACHINE;
FIRST IN FIRST OUT MEMORIES;
SCAN TEST GENERATION;
INTEGRATED CIRCUIT TESTING;
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EID: 0033326303
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (5)
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References (7)
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