Interface stability of magnetic tunnel barriers and electrodes

Physica Status Solidi (A) Applications and Materials Science

Volumn 204, Issue 8, 2007, Pages 2778-2784

  Lamperi, A ^a   Pym, A T G ^a   Eastwood, D S ^a   Cardoso, S ^b   Wisniowski, P ^b   Freitas, P P ^b   Anderson, G I R ^c   Marrows, C H ^c   Tanner, B K ^a  

^a DURHAM UNIVERSITY   (United Kingdom)

^b INESC   (Portugal)

^c UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACE STABILITY; KIESSIG FRINGE STRUCTURE; SPECULAR REFLECTIVITY MEASUREMENTS; TUNNELLING MAGNETORESISTANCE (TMR);

ANNEALING; CRYSTALLIZATION; INTERFACES (MATERIALS); MAGNETORESISTANCE; MULTILAYERS; X RAY SCATTERING;

TUNNEL JUNCTIONS;

EID: 34548226829     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200675682     Document Type: Article

References (23)

1. C. Y. Chou, Y. D. Yao, P. C. Kuo, K. W. Cheng, and C. Yu, J. Magn. Magn. Mater. 304, e103 (2006).
2. S. Cardoso, Z. Zhang, and P. P. Freitas, J. Appl. Phys. 89, 6650 (2001).
3. J. Y. Bae, W. C. Lin, H. J. Kim, T. W. Kim, and T. D. Lee, Jpn. J. Appl. Phys., Part 1 44, 3002 (2005).
4. J. Y. Bae, W. C. Lin, H. J. Kim, T. D. Lee, K. W. Kim, and T. W. Kim, J. Appl. Phys. 99, 08T316 (2006).
5. S. Yuasa, T. Nagahama, A. Fukushima, Y. Suzuki, and K. Ando, Nature Mater. 3, 868 (2004).
6. R. Jansen and J. S. Moodera, Phys. Rev. B 61, 9047 (2000).
7. E. Yu. Tsymbal and D. G. Pettifor, J. Appl. Phys. 85, 5801 (1999).
8. S. Cardoso, C. Cavaco, R. Ferreira, L. Pereira, M. Rickart, P. P. Freitas, N. Franco, J. Gouveia, and N. P. Barradas, J. Appl. Phys. 97, 10C916 (2005).
9. D. Wang, C. Nordman, J. Daughton, Z. Qian, and J. Fink, IEEE Trans. Magn. 40, 2269 (2004).
10. A. Kaüfler, Y. Luo, K. Samwer, G. Gieres, M. Vieth, and J. Wecker, J. Appl. Phys. 91, 1701 (2002).
11. S. S. P. Parkin, C. Kaiser, A. Panchula, P. M. Rice, D. Hughes, M. Smant, and S.-H. Yang, Nature (London) 3, 868 (2004).
12. D. D. Djayaprawira, K. Tsunekawa, M. Nagai, H. Maehara, S. Yamagata, N. Watanabe, S. Yuasa, Y. Suzuki, and K. Ando, Appl. Phys. Lett. 86, 092502 (2005).
13. J. Hayakawa, S. Ikeda, F. Matsukura, H. Takahashi, and H. Ohno, Jpn. J. Appl. Phys., Part 2 44, L587 (2005).
14. C. Park, J.-G. Zhu, M. T. Moneck, Y. Peng, and D. E. Laughlin, J. Appl. Phys. 99, 08A901 (2006).
15. A. T. G. Pym, A. Lamperti, T. Dimopoulos, M. Rührig, J. Wecker, and B. K. Tanner, Appl. Phys. Lett. 88, 162505 (2006).
16. G. I. R. Anderson, A. T. Hindmarch, C. H. Marrows, and B. J. Hickey, J. Appl. Phys. 99, 08T311 (2006).
17. S. Cardoso, V. Gehanno, R. Ferreira, and P. P. Freitas, IEEE Trans. Magn. 35, 2952 (1999).
18. A. T. G. Pym, A. Lamperti, S. Cardoso, P. P. Freitas, and B. K. Tanner, Superlattices Microstruct. 41, 122 (2007).
19. S. D. Brown, et al., Nucl. Instrum. Methods Phys. Res. A 467/468, 727 (2001).
20. M. Wormington, I. Pape, T. P. A. Hase, B. K. Tanner, and D. K. Bowen, Philos. Mag. Lett. 74, 211 (1996).
21. M. Wormington, C. Panaccione, K. M. Matney, and D. K. Bowen, Philos. Trans. R. Soc. Lond. A 357, 2827 (1999).
22. J. Als-Nielsen and D. McMorrow, Elements of Modern X-Ray Physics (John Wiley & Sons Ltd, Chichester, West Sussex, England, 2001).
23. T. Dimopoulos, G. Gieres, J. Wecker, N. Wiese, and M. D. Sacher, J. Appl. Phys. 96, 6382 (2004).