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Volumn 467-468, Issue , 2001, Pages 727-732
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Instrument developments for magnetic and high-resolution diffraction at the XMaS beamline
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Author keywords
Beamline instrumentation; Polarisation analysis; Sample alignment; Vacuum slits
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Indexed keywords
LIGHT POLARIZATION;
SYNCHROTRON RADIATION;
VACUUM;
X RAY DIFFRACTION;
X RAY OPTICS;
VACUUM SLITS;
MONOCHROMATORS;
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EID: 0035928250
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(01)00479-X Document Type: Conference Paper |
Times cited : (7)
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References (5)
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