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Volumn 467-468, Issue , 2001, Pages 727-732

Instrument developments for magnetic and high-resolution diffraction at the XMaS beamline

Author keywords

Beamline instrumentation; Polarisation analysis; Sample alignment; Vacuum slits

Indexed keywords

LIGHT POLARIZATION; SYNCHROTRON RADIATION; VACUUM; X RAY DIFFRACTION; X RAY OPTICS;

EID: 0035928250     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00479-X     Document Type: Conference Paper
Times cited : (7)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.