Electrode roughness and interfacial mixing effects on the tunnel junction thermal stability

Journal of Applied Physics

Volumn 89, Issue 11 II, 2001, Pages 6650-6652

  Cardoso, S ^a,b   Freitas, P P ^a,b   Zhang, Z G ^a   Wei, P ^c,d   Barradas, N ^c,d   Soares, J C ^c,d  

^a INESC   (Portugal)

^b INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^c INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^d UNIVERSITY OF LISBON   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035356053     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1359216     Document Type: Article

References (8)

1. S. Cardoso, P. P. Freitas, C. de Jesus, P. Wei, and J. C. Soares, Appl. Phys. Lett. 76, 610 (2000).
2. P. P. Freitas, S. Cardoso, R. C. Sousa, W. Ku, R. Ferreira, J. P. Conde, and V. Chu, IEEE Trans. Magn. (to be published).
3. S. Tehrani, J. M. Slaughter, E. Chen, M. Durlam, J. Shi, and M. De Herrera, IEEE Trans. Magn. 35, 2814 (1999).
4. J. J. Sun et al., Appl. Phys. Lett. 76, 2424 (2000).
5. S. Cardoso, V. Gehanno, R. Ferreira, and P. P. Freitas, IEEE Trans. Magn. 35, 2952 (1999).
6. N. P. Barradas, C. Jeynes, and R. P. Webb, Appl. Phys. Lett. 71, 291 (1997); E. Szilagyi, F. Paszti, and G. Amsel, Nucl. Instrum. Methods Phys. Res. B 100, 103 (1995).
7. N. P. Barradas, C. Jeynes, and R. P. Webb, Appl. Phys. Lett. 71, 291 (1997); E. Szilagyi, F. Paszti, and G. Amsel, Nucl. Instrum. Methods Phys. Res. B 100, 103 (1995).
8. S. P. Parkin, K.-S. Moon, K. E. Pettit, D. J. Smith, R. E. D. Borkowski, and M. R. McCartney, Appl. Phys. Lett. 75, 543 (1999).