On accelerating soft-error detection by targeted pattern generation

Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007

Volumn , Issue , 2007, Pages 723-728

  Sanyal, Alodeep ^a   Ganeshpure, Kunal ^a   Kundu, Sandip ^a  

^a University of Massachusetts

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; FAILURE ANALYSIS; INTEGRATED CIRCUITS; PATTERN RECOGNITION;

ERROR RATE TESTING; PATTERN SELECTION TECHNIQUE; VULNERABLE NODES;

ERROR DETECTION;

EID: 34548133300     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2007.108     Document Type: Conference Paper

References (22)

1. R. C. Baumann, "Tutorial: Ghosts in the machine: A tutorial on single-event upsets in advanced commercial silicon technology," in Proc. Int'l Test Conf., 2004
2. C. M. Hsieh, P. C. Murley, and R. R. O'Brien, "Dynamics of charge collection from alpha-particle tracks in integrated circuits," in Proc. IRPS, pp. 38-42, 1981
3. R. C. Baumann, "Soft errors in advanced semiconductor devices-part I: the three radiation sources," IEEE Trans. Device and Materials Reliability, Vol. 1, No. 1, pp. 17-22, 2001
4. st Annual Int'l Reliability Physics Symposium, pp. 60-70, 2003
5. P. Shivakumar, M. Kistler, S. W. Keckler, D. Burger, and L. Alvisi, "Modeling the effect of technology trends on the soft error rate of combinational logic," in Proc. Int'l conf. Dependable Systems and Networks, pp. 389-398, 2002
6. C. Weaver, J. Emer, S. S. Mukherjee, and S. K. Reinhardt, "Techniques to reduce the soft error rate of a high-performance microprocessor," in Proc. Int'l Symposium Comp. Arch. (ISCA), 2004
7. I. Polian, J. P. Hayes, S. Kundu, and B. Becker, "Transient fault characterization in dynamic noisy environments," in Proc. Int'l Test Conf., 2005
8. H. Kobayashi, H. Usuki, K. shiraishi, H. Hiroo Tsuchiya, N. Kawamoto, G. Merchant, and J. Kase, "Comparison between neutron-induced system-SER and accelerated-SER in SRAMs," in Proc. Int'l Reliability Phys. Symp., pp. 288-293, 2004
9. N. Seifert, X. Zhu, and L. W. Massengill, "Impact of scaling on soft-error rates in commercial microprocessors," IEEE Trans. On Nuclear Science, Vol. 49, No. 6, pp. 3100-3106, 2002
10. P. E. Dodd, and L. W. Massengill, "Basic mechanisms and modeling of single-event upset in digital microelectronics," IEEE Trans. Nuclear Science, Vol. 50, No. 3, pp. 583-602, 2003
11. P. Liden, P. Dahlgren, R. Johansson, and J. Karlsson, "On latching probability of particle induced transients in combinational networks," in Proc. Symp. Fault Tolerant Computing, pp. 340-349, 1994
12. International Technology Roadmap for Semiconductors (ITRS) 2003 Edition: Process Integration, Devices, and Structures, 2003
13. S. S. Mukherjee, J. Emer, and S. K. Reinhardt, "The soft error problem: an architectural perspective," in Proc. Int'l Symp. High-Perf. Comp. Arch., 2005
14. Y Tosaka, S. Satoh, T. Itakura, H. Ehara, T. Ueda, G. A. Woffinden, and S. A. Wender, "Measurement and analysis of neutron-induced soft errors in sub-half-micron CMOS circuits," ZEEE Trans. Electron Devices, Vol. 45, No. 7, 1998
15. Y Tosaka, H. Kanata, S. Satoh, and T. Itakura, "Simple method for estimating neutron-induced soft error rates based on modified BGR model," IEEE Electron Device Letters, Vol. 20, No. 2, 1999
16. G. R. Srinivasan, P. C. Murley, and H. K. Tang, "Accurate, predictive modeling of soft error rate due to cosmic rays and chip alpha radiation," in Proc. Int'l Reliability Physics Symposium, 1994
17. M. Zhang, and N. R. Shanbhag, "A soft error rate analysis methodology," in Proc.Int'l Conf. Computer-Aided Design, 2004
18. S. Krishnaswamy, I. L. Markov and J. P. Hayes, "Testing Logic Circuits for Transient Faults," in Proc. IEEE European. Test Symposium (ETS), pp. 102-107, 2005
19. J. W. Gault, J. P. Robinson, and S. M. Reddy, "Multiple fault detection in combinational networks," ZEEE Trans. Computers, Vol. C-21, No. 1, pp. 31-36, 1972
20. T. Larrabee, "Test Pattern Generation Using Boolean Satisfiability", ZEEE Trans. Computer-Aided Design, Vol. 11, No. 1, Jan. 1992, pp. 4-15.
21. J.L. Barth, C.S. Dyer, E.G. Stassinopoulos, "Space, atmospheric, and terrestrial radiation environments," IEEE Trans, on Nuclear Science, 50(3), pp. 466-482, 2003.
22. http://www.gnu.org/software/glpk./