Comparison between neutron-induced system-SER and accelerated-SER in SRAMs

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2004, Pages 288-293

  Kobayashi, Hajime ^a   Usuki, Hideki ^a   Shiraishi, Ken ^a   Tsuchiya, Hiroo ^a   Kawamoto, Nobutaka ^a   Merchant, Ghulam ^a   Kase, Jun ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH INTENSITY RADIATION; NEUTRON FLUX; SOFT ERROR RATES (SER);

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; COSMIC RAYS; MAGNETIC SHIELDING; MATHEMATICAL MODELS; NEUTRONS;

STATIC RANDOM ACCESS STORAGE;

EID: 3042565040     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

1. J. F. Ziegler et al., "IBM experiments in soft fails in computer electronics (1978-1994)", IBM J. Res. Develop. Vol.40 No.1 p.3-18 (1996)
2. R. C. Baumann and E. B. Smith, "Neutron-induced Boron fission as a major source of soft errors in deep submicron SRAM devices", IEEE Proc. IRPS Symp., p.152-157 (2000)
3. H. Kobayashi, K. Shiraishi, H. Tsuchiya, M. Motoyoshi, H. Usuki, Y. Nagai, K. Takahisa, T. Yoshiie, Y. Sakurai and T. Ishizaki, "Soft errors in SRAM devices induced by high energy neutrons, thermal neutrons and alpha particles", IEDM Tech. Dig., p.337-340 (2002)
4. G. R. Srinivasan, "Modeling the cosmic-ray-induced soft-error rate in integrated circuits: An overview", IBM J. Res. Develop. Vol.40 No. 1 p.77-89 (1996)
5. Y. Tosaka, H. Kanata, T. Itakura and S. Satoh, "Simulation technologies for cosmic ray neutron-induced soft errors: Models and simulation systems", IEEE Trans. Nucl. Sci. Vol. 46, No. 3, p.774-780 (1999)
6. Y. Tosaka, H. Kanata, S. Satoh and T. Itakura, "Simple method for estimating neutron-induced soft error rates based on modified BGR model", IEEE Ele. Dev. Lett., Vol. 20, No. 2, p.89-91 (1999).
7. E. Ibe, Y. Yahagi, F. Kataoka, Y. Saito, A. Eto, M. Sato, H. Kameyama and M. Hidaka, "A self-consistent integrated system for terrestrial-neutron induced single event upset of semiconductor devices at the ground", 2002 International Conference on Information Technology and Application, Bathurst, No. 273-21 (2002)
8. JEDEC standard, 'Measurement and reporting of alpha particles and terrestrial cosmic ray-induced soft errors in semiconductor devices', JESD89 (2001)
9. P. W. Lisowki, C. D. Bowman, G. J. Russell and S. A. Wender, "The Los Alamos National Laboratory spallation neutron sources", Nucl. Sci. Eng. Vol. 106, p. 208-218 (1990)
10. S. A. Wender, S. Balestrini, A. Brown, R. C. Haight, C. M. Laymon, T. M. Lee, P. W. Lisowski, W. McCorkle, R. O. Nelson and W. Parker, "A fission ionization detector for neutron flux measurements at a spallation source", Nucl. Inst. Meth. A, Vol. 336, p. 226-231 (1993)
11. S. A. Wender, private communication
12. W. L. Bendel and E. L. Petersen, "Proton upsets in orbit", IEEE Trans. Nucl. Sci., Vol. 30, No.6, p. 4481-4485 (1983)
13. Moscow Neutron Monitor, http://cr0.izmiran.rssi.ru./mosc/main.htm
14. W. N. Hess, H. W. Patterson and R. Wallace, "Cosmic-ray neutron energy spectrum", Phys. Rev. Vol. 116, No.2, p. 445-457 (1959)
15. J. F. Ziegler, "Terrestrial cosmic rays", IBM J. Res. Develop. Vol.40 No.1 p.19-39 (1996)
16. T. Nakamura, Y. Uwamino, T. Ohkubo and A. Hara, "Altitude variation of cosmic-ray neutrons", Health Phys., Vol. 53, No. 5, p. 509-517 (1987)