Transient fault characterization in dynamic noisy environments

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 1039-1048

  Polian, Ilia ^a   Hayes, John P ^a,b   Kundu, Sandip ^a,c   Becker, Bernd ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

^b UNIVERSITY OF MICHIGAN   (United States)

^c UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

Fault detection; Fault modeling; On line characterization; Soft faults; Transient faults

Indexed keywords

ERROR DETECTION; OBSERVABILITY; ONLINE SYSTEMS; SPURIOUS SIGNAL NOISE; TRANSIENTS;

FAULT DETECTION; FAULT MODELING; ONLINE CHARACTERIZATION; SOFT FAULTS; TRANSIENT FAULTS;

INTEGRATED CIRCUIT TESTING;

EID: 33847105879     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584070     Document Type: Conference Paper

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