A carbon nanofibre scanning probe assembled using an electrothermal microgripper

Nanotechnology

Volumn 18, Issue 34, 2007, Pages

  Carlson, K ^a   Andersen, K N ^a   Eichorn, V ^b   Petersen, D H ^a   Molhave K ^a   Bu, I Y Y ^c   Teo, K B K ^c   Milne, W I ^c   Fatikow, S ^b   Boggild P ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b UNIVERSITY OF OLDENBURG   (Germany)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; SELF ASSEMBLED MONOLAYERS;

ATOMIC FORCE MICROSCOPE CANTILEVERS; COMPACT SILICON MICROGRIPPERS; PYRAMIDAL SILICON TIPS;

CARBON NANOFIBERS;

CARBON; MULTI WALLED NANOTUBE; NANOFIBER; SILICON;

ARTICLE; ATOMIC ABSORPTION SPECTROMETRY; ATOMIC FORCE MICROSCOPY; CATALYST; DEVICE REMOVAL; ELECTRON MICROSCOPE; PERFORMANCE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPE; SCANNING PROBE MICROSCOPY; TENSILE STRENGTH;

EID: 34547740603     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/34/345501     Document Type: Article

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