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Volumn 25, Issue 4, 2007, Pages 1427-1431

Analysis of local carrier modulation in InAs semiconductor nanowire transistors

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT MODULATION EFFECTS; LOCAL CARRIER MODULATION; SCANNING GATE MICROSCOPY; SEMICONDUCTOR NANOWIRE TRANSISTORS;

EID: 34547605962     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2746355     Document Type: Article
Times cited : (6)

References (28)
  • 5
    • 0035827304 scopus 로고    scopus 로고
    • M. H. Huang, Science 292, 1897 (2002).
    • (2002) Science , vol.292 , pp. 1897
    • Huang, M.H.1
  • 26
    • 34547602469 scopus 로고    scopus 로고
    • Integrated System Engineering (ISE), Technology CAD (TCAD) software products, covering processing, device modeling, circuit, and system simulation uto package simulation.
    • Integrated System Engineering (ISE), Technology CAD (TCAD) software products, covering processing, device modeling, circuit, and system simulation up to package simulation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.