Local electronic transport through InAs/InP(0 0 1) quantum dots capped with a thin InP layer studied by an AFM conductive probe

Semiconductor Science and Technology

Volumn 22, Issue 7, 2007, Pages 755-762

  Troyon, M ^a   Smaali, K ^a   Molinari, M ^a   Hdiy, A El ^a   Saint Girons, G ^b   Patriarche, G ^b  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CURRENT CONTROL; ELECTRON TRANSPORT PROPERTIES; INDIUM PHOSPHIDE; THIN FILMS;

ELECTRON BEAM INDUCED CURRENT (EBIC); ELLIPTIC TERRACE-LIKE STRUCTURES; ENERGY BAND DIAGRAMS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 34547367471     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/22/7/014     Document Type: Article

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