Accurate assembly and size control of cu nanoparticles into nanowires by contact atomic force microscope-based nanopositioning

Journal of Physical Chemistry C

Volumn 111, Issue 27, 2007, Pages 10105-10109

  Yang, De Quan ^a   Sacher, Edward ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BOND STRENGTH (CHEMICAL); CONTACT ANGLE; COPPER; SUBSTRATES;

CONTACT MODES; DOW CYCLOTENE SUBSTRATES; NANOPOSITIONING; UNIDIRECTIONAL SWEEPING;

NANOWIRES;

EID: 34547346917     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp071998o     Document Type: Article

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