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Volumn 46, Issue 6 A, 2007, Pages 3527-3533

Multireflection effect on formation of periodic surface structure on an Si film melting-crystallized by a linearly polarized Nd:YAG pulse laser beam

Author keywords

Crystallization; Green laser; Multireflection; Si film; TFT; YAG laser

Indexed keywords

CRYSTALLIZATION; GLASS; LASER BEAMS; LIGHT REFLECTION; SUBSTRATES; SURFACE STRUCTURE;

EID: 34547217468     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.3527     Document Type: Article
Times cited : (4)

References (32)
  • 29
    • 0042612137 scopus 로고
    • ed. R. F. Wood, C. W. White, and R. T. Young Academic, Orlando
    • G. E. Jellison, Jr.: in Semiconductors and Semimetals, ed. R. F. Wood, C. W. White, and R. T. Young (Academic, Orlando, 1984) Vol. 23, p. 95.
    • (1984) Semiconductors and Semimetals , vol.23 , pp. 95
    • Jellison Jr., G.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.