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Volumn 78, Issue 15, 2001, Pages 2250-2252
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Alignment of grain boundary in a Si film crystallized by a linearly polarized laser beam on a glass substrate
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035831799
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1362336 Document Type: Article |
Times cited : (22)
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References (21)
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