Capillary waves in pulsed excimer laser crystallized amorphous silicon

Applied Physics Letters

Volumn 68, Issue 15, 1996, Pages 2138-2140

  Fork, D K ^a   Anderson, G B ^a   Boyce, J B ^a   Johnson, R I ^a   Mei, P ^a  

^a PALO ALTO RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; DAMPING; EXCIMER LASERS; FREEZING; GRAIN GROWTH; RAYLEIGH SCATTERING; SOLIDIFICATION; SURFACE ROUGHNESS; THICK FILMS; TRANSMISSION ELECTRON MICROSCOPY; VELOCITY;

CAPILLARY WAVES; FILM THICKNESS; LASER FLUENCE; SHORT PULSE LASER CRYSTALLIZATION; SUPERLATERAL GROWTH;

AMORPHOUS SILICON;

EID: 0030574951     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115610     Document Type: Article

References (15)

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