Imaging characterization of carbon nanotube tips modified using a focused ion beam

Applied Surface Science

Volumn 253, Issue 16, 2007, Pages 6872-6877

  Shin, Young Hyun ^a   Song, Jin Won ^a   Lee, Eung Sug ^a   Han, Chang Soo ^a  

^a Korea Institute of Machine and Materials   (South Korea)

Author keywords

Atomic force microscopy; Carbon nanotube; Imaging; Wear

Indexed keywords

CHARACTERIZATION; FOCUSED ION BEAMS; IMAGING SYSTEMS; SCANNING; SILICON;

DEEP TRENCH ACCESSIBILITY; IMAGING CHARACTERIZATION; NANOSCALE STRUCTURES;

CARBON NANOTUBES;

EID: 34248337106     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.01.135     Document Type: Article

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