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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 7 B, 2002, Pages 4887-4889

Length adjustment of carbon nanotube probe by electron bombardment

(2) Akita, Seiji a Nakayama, Yoshikazu a

a Osaka Prefecture University (Japan)

Author keywords

Carbon nanotube; Field emission; Field evaporation; Nanomanipulation; Nanoprocessing; Scanning probe microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; ELECTRON EMISSION; KINETIC ENERGY; PLASMA ETCHING; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON BOMBARDMENT;

CARBON NANOTUBES;

EID: 0036657183 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.41.4887 Document Type: Conference Paper

Times cited : (37)

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