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Volumn 82, Issue 15, 2003, Pages 2506-2508

Simple and efficient method for carbon nanotube attachment to scanning probes and other substrates

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; MAGNETIC FIELDS; PROBES; SCANNING;

EID: 0037651044     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1567049     Document Type: Article
Times cited : (35)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.