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Volumn 82, Issue 15, 2003, Pages 2506-2508
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Simple and efficient method for carbon nanotube attachment to scanning probes and other substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
IMAGE ANALYSIS;
MAGNETIC FIELDS;
PROBES;
SCANNING;
MAGNETOPHORETIC MODELS;
CARBON NANOTUBES;
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EID: 0037651044
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1567049 Document Type: Article |
Times cited : (35)
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References (14)
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