Controlled modification of the morphology and structure of carbon nanotube probes using a focused ion beam

Carbon

Volumn 44, Issue 15, 2006, Pages 3375-3378

  Han, C S ^a   Park, J K ^a   Yoon, Y H ^a   Shin, Y H ^a  

^a Korea Institute of Machine and Materials   (South Korea)

Author keywords

Atomic force microscopy; Carbon nanotube; Focused ion beam

Indexed keywords

EID: 33751003804     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2006.06.017     Document Type: Letter

References (7)

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