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Volumn 50, Issue 2-3, 2007, Pages 284-290

Molecular beam epitaxy growth of HgCdTe for high performance infrared photon detectors

Author keywords

HgCdTe; Infrared; Material Uniformity; MBE; Molecular beam epitaxy; Photon detector

Indexed keywords

CADMIUM COMPOUNDS; EPITAXIAL GROWTH; INFRARED DETECTORS; MERCURY COMPOUNDS; PHOTOCONDUCTIVITY; SUPERLATTICES;

EID: 34047148327     PISSN: 13504495     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.infrared.2006.10.017     Document Type: Article
Times cited : (13)

References (36)
  • 22
    • 34047124104 scopus 로고    scopus 로고
    • Y. Chang, G. Badano, E. Jiang, J. Zhao, Y.D. Zhou, C.H. Grein, S. Sivananthan, Composition, thickness and Urbach slope distribution of HgCdTe MBE wafers by infrared microscope mapping, in: 2002 US Workshop on Physics and Chemistry of II-VI Materials, San Diego, CA, 2002.
  • 24
    • 34047191773 scopus 로고    scopus 로고
    • H. Abad, J. Zhao, G. Badano, Y. Chang, S. Sivananthan, in: Military Sensing Symposia, 22-26 March 2004, Tucson, AZ, USA.
  • 30
    • 34047169667 scopus 로고    scopus 로고
    • Y. Chang, C.H. Grein, J. Zhao, S. Sivananthan, C.Z. Wang, T. Aoki, D.J. Smith, P.S. Wijewarnasuriya, V. Nathan, J. Appl. Phys., in press.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.