Uniformity of optical absorption in HgCdTe epilayer measured by infrared spectromicroscopy

Applied Physics Letters

Volumn 83, Issue 18, 2003, Pages 3701-3703

  Phillips, J D ^a   Moazzami, K ^a   Kim, J ^a   Edwall, D D ^b   Lee, D L ^b   Arias, J M ^b  

^a The Department of Civil and Environmental Engineering   (United States)

^b ROCKWELL SCIENTIFIC COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; ELLIPSOMETRY; FEEDBACK CONTROL; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED DETECTORS; INFRARED TRANSMISSION; LIGHT ABSORPTION; LIGHT MEASUREMENT; MICROSCOPES; MICROSCOPIC EXAMINATION; MOLECULAR BEAM EPITAXY; SYNCHROTRON RADIATION;

INFRARED SPECTROMICROSCOPY; INFRARED TRANSMISSION MICROSCOPY; UNIFORMITY;

MERCURY COMPOUNDS;

EID: 0344928509     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1625776     Document Type: Article

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