Modeling and verification of single event transients in deep submicron technologies

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2004, Pages 673-674

  Gadlage, Matthew J ^a   Schrimpf, Ronald D ^a   Benedetto, Joseph M ^b   Eaton, Paul H ^b   Turflinger, Thomas L ^c  

^a VANDERBILT UNIVERSITY   (United States)

^b MISSION RESEARCH CORPORATION   (United States)

^c NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

Single Event Effects (SEEs); Single Event Transients (SETs)

Indexed keywords

DUAL INTERLOCKED CELLS (DICE); SINGLE EVENT EFFECTS (SEE); SINGLE EVENT TRANSIENTS (SET);

COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; ELECTRIC INVERTERS; ELECTRIC POTENTIAL; FLIP FLOP CIRCUITS; LOGIC GATES; MATHEMATICAL MODELS; NAND CIRCUITS; PHOTOCURRENTS;

INTEGRATED CIRCUITS;

EID: 3042609601     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. David G. Mavis and Paul H. Eaton, "Soft Error Rate Mitigation Techniques for Modern Microcircuits", Reliability Physics Symposium Proceedings, 2002. 40th Annual, 2002, pp. 216-225
2. Lloyd Massengill, "SEU Modeling and Prediction Techniques", IEEE Nuclear and Space Radiation Effects Conference Short Course Text, 1993.
3. M. P. Baze and S. P. Buchner, "Attenuation of Single Event Induced Pulses in CMOS Combinatorial Logic", IEEE Transactions on Nuclear Science, Vol. 44, No. 6, December 1997, pp. 2217-2223.