-
1
-
-
0031166784
-
-
M. Cao, T. Kamins, P. V. Voorde, C. Diaz, and W. Greene, IEEE Electron Device Lett. 18, 251 (1997).
-
(1997)
IEEE Electron Device Lett.
, vol.18
, pp. 251
-
-
Cao, M.1
Kamins, T.2
Voorde, P.V.3
Diaz, C.4
Greene, W.5
-
2
-
-
0033280874
-
-
J. Chen, B. Maiti, D. Connelly, M. Mendicino, F. Huang, O. Adetutu, Y. Yu, D. Weddington, W. Wu, J. Candelaria, D. Dow, P. Tobin, and J. Mogab, Symp. VLSI Tech. Dig. 1999, 25.
-
(1999)
Symp. VLSI Tech. Dig.
, pp. 25
-
-
Chen, J.1
Maiti, B.2
Connelly, D.3
Mendicino, M.4
Huang, F.5
Adetutu, O.6
Yu, Y.7
Weddington, D.8
Wu, W.9
Candelaria, J.10
Dow, D.11
Tobin, P.12
Mogab, J.13
-
3
-
-
0035337187
-
-
Y. C. Yeo, Q. Lu, P. Ranade, H. Takeuchi, K. J. Yang, I. Polishchuk, T. J. King, C. Hu, S. C. Song, H. F. Luan, and D. L. Kwong, IEEE Electron Device Lett. 22, 227 (2001).
-
(2001)
IEEE Electron Device Lett.
, vol.22
, pp. 227
-
-
Yeo, Y.C.1
Lu, Q.2
Ranade, P.3
Takeuchi, H.4
Yang, K.J.5
Polishchuk, I.6
King, T.J.7
Hu, C.8
Song, S.C.9
Luan, H.F.10
Kwong, D.L.11
-
4
-
-
0033745206
-
-
I. De, D. Johri, A. Srivastava, and C. M. Osburn, Solid-State Electron. 44, 1077 (2000).
-
(2000)
Solid-State Electron.
, vol.44
, pp. 1077
-
-
De, I.1
Johri, D.2
Srivastava, A.3
Osburn, C.M.4
-
5
-
-
33644625154
-
-
C. L. Cheng, K. S. Chang-Liao, T. C. Wang, T. K. Wang, and H. C. H. Wang, IEEE Electron Device Lett. 27, 148 (2006).
-
(2006)
IEEE Electron Device Lett.
, vol.27
, pp. 148
-
-
Cheng, C.L.1
Chang-Liao, K.S.2
Wang, T.C.3
Wang, T.K.4
Wang, H.C.H.5
-
6
-
-
33846999979
-
-
C. Ren, D. S. H. Chan, W. Y. Loh, S. Balakumar, A. Y. Du, C. H. Tung, G. Q. Lo, R. Kumar, N. Balasubramanian, and D.-L. Kwong, IEEE Electron Device Lett. 27, 811 (2006).
-
(2006)
IEEE Electron Device Lett.
, vol.27
, pp. 811
-
-
Ren, C.1
Chan, D.S.H.2
Loh, W.Y.3
Balakumar, S.4
Du, A.Y.5
Tung, C.H.6
Lo, G.Q.7
Kumar, R.8
Balasubramanian, N.9
Kwong, D.-L.10
-
12
-
-
33746536121
-
-
C. L. Cheng, C. Y. Lu, K. S. Chang-Liao, C. H. Huang, S. H. Wang, and T. K. Wang, IEEE Trans. Electron Devices 53, 63 (2006).
-
(2006)
IEEE Trans. Electron Devices
, vol.53
, pp. 63
-
-
Cheng, C.L.1
Lu, C.Y.2
Chang-Liao, K.S.3
Huang, C.H.4
Wang, S.H.5
Wang, T.K.6
-
13
-
-
10944269095
-
-
C. L. Cheng, K. S. Chang-Liao, C. H. Huang, and T. K. Wang, Appl. Phys. Lett. 85, 4723 (2004).
-
(2004)
Appl. Phys. Lett.
, vol.85
, pp. 4723
-
-
Cheng, C.L.1
Chang-Liao, K.S.2
Huang, C.H.3
Wang, T.K.4
-
14
-
-
1842738104
-
-
J. F. Conley, Jr., Y. Ono, and D. J. Tweet, Appl. Phys. Lett. 84, 1913 (2004).
-
(2004)
Appl. Phys. Lett.
, vol.84
, pp. 1913
-
-
Conley Jr., J.F.1
Ono, Y.2
Tweet, D.J.3
-
15
-
-
0013132805
-
-
C. K. Chiang, W. E. Wallace, G. W. Lynn, D. Feiler, and W. Xia, Appl. Phys. Lett. 76, 430 (2000).
-
(2000)
Appl. Phys. Lett.
, vol.76
, pp. 430
-
-
Chiang, C.K.1
Wallace, W.E.2
Lynn, G.W.3
Feiler, D.4
Xia, W.5
-
18
-
-
33846943761
-
-
C. Y. Lu, K. S. Chang-Liao, P. H. Tsai, and T. K. Wang, IEEE Electron Device Lett. 27, 859 (2006).
-
(2006)
IEEE Electron Device Lett.
, vol.27
, pp. 859
-
-
Lu, C.Y.1
Chang-Liao, K.S.2
Tsai, P.H.3
Wang, T.K.4
|