-
1
-
-
0344749552
-
-
Garcia, J. M.; Mankad, T.; Holtz, P. O.; Wellman, P. J.; Petroff, P. M. Appl. Phys. Lett. 1998, 72, 3172.
-
(1998)
Appl. Phys. Lett
, vol.72
, pp. 3172
-
-
Garcia, J.M.1
Mankad, T.2
Holtz, P.O.3
Wellman, P.J.4
Petroff, P.M.5
-
2
-
-
0000923738
-
-
Harris, L.; Mawbray, D. J.; Skolnick, M. S.; Hopkinson, M.; Hill, G. Appl. Phys. Lett. 1998, 73, 969.
-
(1998)
Appl. Phys. Lett
, vol.73
, pp. 969
-
-
Harris, L.1
Mawbray, D.J.2
Skolnick, M.S.3
Hopkinson, M.4
Hill, G.5
-
3
-
-
0032487186
-
-
Maimon, S.; Finkman, E.; Bahir, G.; Schacham, S. E.; Garcia, J. M.; Petroff, P. M. Appl. Phys. Lett. 1998, 73, 2003.
-
(2003)
Appl. Phys. Lett
, vol.1998
, pp. 73
-
-
Maimon, S.1
Finkman, E.2
Bahir, G.3
Schacham, S.E.4
Garcia, J.M.5
Petroff, P.M.6
-
4
-
-
0033579345
-
-
Lundström, T.; Schoenfeld, W.; Lee, H.; Petroff, P. M. Science 1999, 286, 2312.
-
(1999)
Science
, vol.286
, pp. 2312
-
-
Lundström, T.1
Schoenfeld, W.2
Lee, H.3
Petroff, P.M.4
-
5
-
-
0000556220
-
-
Heitz, R.; Veit, M.; Ledentsov, N. N.; Hoffmann, A.; Bimberg, D.; Ustinov, V. M.; Kop'ev, P. S.; Alferov, Zh. I. Phys. Rev. B 1997, 56, 10435.
-
(1997)
Phys. Rev. B
, vol.56
, pp. 10435
-
-
Heitz, R.1
Veit, M.2
Ledentsov, N.N.3
Hoffmann, A.4
Bimberg, D.5
Ustinov, V.M.6
Kop'ev, P.S.7
Alferov, Z.I.8
-
6
-
-
0000365510
-
-
Heitz, R.; Mukhametzhanov, I.; Stier, O.; Madhukar, A.; Bimberg, D. Phys. Rev. Lett. 1999, 83, 4654.
-
(1999)
Phys. Rev. Lett
, vol.83
, pp. 4654
-
-
Heitz, R.1
Mukhametzhanov, I.2
Stier, O.3
Madhukar, A.4
Bimberg, D.5
-
7
-
-
0035102708
-
-
Minnaert, A. W. E.; Silov, A. Y.; van der Vleuten, W.; Haverkort, J. E. M.; Wolther, J. H. Phys. Rev. B 2001, 63, 075303.
-
(2001)
Phys. Rev. B
, vol.63
, pp. 075303
-
-
Minnaert, A.W.E.1
Silov, A.Y.2
van der Vleuten, W.3
Haverkort, J.E.M.4
Wolther, J.H.5
-
8
-
-
0001668810
-
-
Findeis, F.; Zrenner, A.; Böhm, G.; Abstreiter, G. Phys. Rev. B 2000, 61, 10579.
-
(2000)
Phys. Rev. B
, vol.61
, pp. 10579
-
-
Findeis, F.1
Zrenner, A.2
Böhm, G.3
Abstreiter, G.4
-
9
-
-
0001641998
-
-
Ohnesorge, B.; Albrecht, M.; Oshinowo, J.; Forchel, A.; Arakawa, Y. Phys. Rev. B 1996, 54, 11532.
-
(1996)
Phys. Rev. B
, vol.54
, pp. 11532
-
-
Ohnesorge, B.1
Albrecht, M.2
Oshinowo, J.3
Forchel, A.4
Arakawa, Y.5
-
11
-
-
0344706958
-
-
Rack, A.; Wetzler, R.; Wacker, A.; Scholl, E. Phys. Rev. B 2002, 66, 165429.
-
(2002)
Phys. Rev. B
, vol.66
, pp. 165429
-
-
Rack, A.1
Wetzler, R.2
Wacker, A.3
Scholl, E.4
-
12
-
-
0000135360
-
-
Raymond, S.; Hinzer, K.; Fafard, S.; Merz, J. L. Phys. Rev. B 2000, 61, 16331.
-
(2000)
Phys. Rev. B
, vol.61
, pp. 16331
-
-
Raymond, S.1
Hinzer, K.2
Fafard, S.3
Merz, J.L.4
-
13
-
-
0029197612
-
-
Efros, A. L.; Kharchenko, V. A.; Rosen, M. Solid State Commun. 1995, 93, 281.
-
(1995)
Solid State Commun
, vol.93
, pp. 281
-
-
Efros, A.L.1
Kharchenko, V.A.2
Rosen, M.3
-
14
-
-
0001194553
-
-
Paskov, P. P.; Holtz, P. O.; Monemar, B.; Garcia, J. M.; Schoenfeld, W. V.; Petroff, P. M. Appl. Phys. Lett. 2000, 77, 812.
-
(2000)
Appl. Phys. Lett
, vol.77
, pp. 812
-
-
Paskov, P.P.1
Holtz, P.O.2
Monemar, B.3
Garcia, J.M.4
Schoenfeld, W.V.5
Petroff, P.M.6
-
15
-
-
0344992029
-
-
Toda, Y.; Moriwaki, O.; Nishioka, M.; Arakawa, Y. Phys. Rev. Lett. 1999, 52, 4114.
-
(1999)
Phys. Rev. Lett
, vol.52
, pp. 4114
-
-
Toda, Y.1
Moriwaki, O.2
Nishioka, M.3
Arakawa, Y.4
-
16
-
-
0037444921
-
-
Monte, A. F. G.; Finley, J. J.; Ashmore, A. D.; Fox, A. M.; Mowbray, D. J.; Skolnik, M. S.; Hopkinson, M. J. Appl. Phys. 2003, 93, 3524.
-
(2003)
J. Appl. Phys
, vol.93
, pp. 3524
-
-
Monte, A.F.G.1
Finley, J.J.2
Ashmore, A.D.3
Fox, A.M.4
Mowbray, D.J.5
Skolnik, M.S.6
Hopkinson, M.7
-
17
-
-
0001664849
-
-
Lobo, C.; Leon, R.; Marcinkevičws, S.; Yang, W.; Sercel, P.; Liao, X. Z.; Zou, J.; Cockayne, D. J. H. Phys. Rev. B 1999, 60, 16647.
-
(1999)
Phys. Rev. B
, vol.60
, pp. 16647
-
-
Lobo, C.1
Leon, R.2
Marcinkevičws, S.3
Yang, W.4
Sercel, P.5
Liao, X.Z.6
Zou, J.7
Cockayne, D.J.H.8
-
18
-
-
0037750656
-
-
Sobolev, M. M.; Kovsh, A. R.; Ustinov, V. M.; Egorov, A. Y.; Zhukov, A. E.; Maksimov, M. V.; Ledentsov, N. N. Semiconductors 1997, 31, 1074.
-
(1997)
Semiconductors
, vol.31
, pp. 1074
-
-
Sobolev, M.M.1
Kovsh, A.R.2
Ustinov, V.M.3
Egorov, A.Y.4
Zhukov, A.E.5
Maksimov, M.V.6
Ledentsov, N.N.7
-
19
-
-
0037116104
-
-
Marcinkevičius, S.; Siegert, J.; Leon, R.; Čechavič ius, B.; Magness, B.; Taylor, W.; Lobo, C. Phys. Rev. B 2002, 66, 235314.
-
(2002)
Phys. Rev. B
, vol.66
, pp. 235314
-
-
Marcinkevičius, S.1
Siegert, J.2
Leon, R.3
Čechavič ius, B.4
Magness, B.5
Taylor, W.6
Lobo, C.7
-
20
-
-
0035982576
-
-
Ménard, S.; Beerens, J.; Morris, D.; Aimez, V.; Beauvais, J.; Fafard, S. J. Vac. Sci. Technol., B 2002, 20, 1501.
-
(2002)
J. Vac. Sci. Technol., B
, vol.20
, pp. 1501
-
-
Ménard, S.1
Beerens, J.2
Morris, D.3
Aimez, V.4
Beauvais, J.5
Fafard, S.6
-
21
-
-
0001585076
-
-
Fry, P. W.; Finley, J. J.; Wilson, L. R.; Lemaître, A.; Mowbray, D. J.; Skolnick, M. S.; Hopkinson, M.; Hill, G.; Clark, J. C. Appl. Phys. Lett. 2000, 77, 4344.
-
(2000)
Appl. Phys. Lett
, vol.77
, pp. 4344
-
-
Fry, P.W.1
Finley, J.J.2
Wilson, L.R.3
Lemaître, A.4
Mowbray, D.J.5
Skolnick, M.S.6
Hopkinson, M.7
Hill, G.8
Clark, J.C.9
-
22
-
-
3042712986
-
-
Moskalenko, E. S.; Donchev, V.; Karlsson, K. F.; Holtz, P. O.; Monemar, B.; Schoenfeld, W. V.; Garcia, J. M.; Petroff, P. M. Phys. Rev. B 2003, 68, 155317.
-
(2003)
Phys. Rev. B
, vol.68
, pp. 155317
-
-
Moskalenko, E.S.1
Donchev, V.2
Karlsson, K.F.3
Holtz, P.O.4
Monemar, B.5
Schoenfeld, W.V.6
Garcia, J.M.7
Petroff, P.M.8
-
23
-
-
0001561075
-
-
Heller, W.; Bockelmann, U.; Abstreiter, G. Phys. Rev. B 1998, 57, 6270.
-
(1998)
Phys. Rev. B
, vol.57
, pp. 6270
-
-
Heller, W.1
Bockelmann, U.2
Abstreiter, G.3
-
24
-
-
0035855058
-
-
Seufert, J.; Obert, M.; Scheibner, M.; Gippius, N. A.; Bacher, G.; Forchel, A.; Passow, T.; Leonarda, K.; Hommel, D. Appl. Phys. Lett. 2001, 79, 1033.
-
(2001)
Appl. Phys. Lett
, vol.79
, pp. 1033
-
-
Seufert, J.1
Obert, M.2
Scheibner, M.3
Gippius, N.A.4
Bacher, G.5
Forchel, A.6
Passow, T.7
Leonarda, K.8
Hommel, D.9
-
25
-
-
13644280627
-
-
Kowalik, K.; Krebs, O.; Lemaître, A.; Laurent, S.; Senellart, P.; Voisin, P.; Gaj, J. A. Appl. Phys. Lett. 2005, 86, 041907.
-
(2005)
Appl. Phys. Lett
, vol.86
, pp. 041907
-
-
Kowalik, K.1
Krebs, O.2
Lemaître, A.3
Laurent, S.4
Senellart, P.5
Voisin, P.6
Gaj, J.A.7
-
26
-
-
33748980814
-
-
Stavarache, V.; Reuter, D.; Wieck, A. D.; Schwab, M.; Yakovlev, D. R.; Oulton, R.; Bayer, M. Appl. Phys. Lett. 2006, 89, 123105.
-
(2006)
Appl. Phys. Lett
, vol.89
, pp. 123105
-
-
Stavarache, V.1
Reuter, D.2
Wieck, A.D.3
Schwab, M.4
Yakovlev, D.R.5
Oulton, R.6
Bayer, M.7
-
27
-
-
33646657680
-
-
Miller, D. A. B.; Chemla, D. S.; Damen, T. C.; Gossard, A. C.; Wiegmann, W.; Wood, T. H.; Burrus, C. A. Phys. Rev. B 1985, 32, 1043.
-
(1985)
Phys. Rev. B
, vol.32
, pp. 1043
-
-
Miller, D.A.B.1
Chemla, D.S.2
Damen, T.C.3
Gossard, A.C.4
Wiegmann, W.5
Wood, T.H.6
Burrus, C.A.7
-
28
-
-
0001263890
-
-
Türck, V.; Rodt, S.; Stier, O.; Heitz, R.; Engelhardt, R.; Pohl, U. W.; Bimberg, D.; Steingrüber, R. Phys. Rev. B 2000, 61, 9944.
-
(2000)
Phys. Rev. B
, vol.61
, pp. 9944
-
-
Türck, V.1
Rodt, S.2
Stier, O.3
Heitz, R.4
Engelhardt, R.5
Pohl, U.W.6
Bimberg, D.7
Steingrüber, R.8
-
29
-
-
0034300365
-
-
Neuhauser, R. G.; Shimizu, K. T.; Woo, W. K.; Empedocles, S. A.; Bawendi, M. G. Phys. Rev. Lett. 2000, 85, 3301.
-
(2000)
Phys. Rev. Lett
, vol.85
, pp. 3301
-
-
Neuhauser, R.G.1
Shimizu, K.T.2
Woo, W.K.3
Empedocles, S.A.4
Bawendi, M.G.5
-
30
-
-
0001378313
-
-
Davydov, V.; Ignatiev, I.; Ren, H. W.; Sugou, S.; Masumoto, Y. Appl. Phys. Lett. 1999, 74, 3002.
-
(1999)
Appl. Phys. Lett
, vol.74
, pp. 3002
-
-
Davydov, V.1
Ignatiev, I.2
Ren, H.W.3
Sugou, S.4
Masumoto, Y.5
-
31
-
-
0035926658
-
-
Sugisaki, M.; Ren, H. W.; Nishi, K.; Masumoto, Y. Phys. Rev. Lett. 2001, 86, 4883.
-
(2001)
Phys. Rev. Lett
, vol.86
, pp. 4883
-
-
Sugisaki, M.1
Ren, H.W.2
Nishi, K.3
Masumoto, Y.4
-
33
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The existence of the charged impurities in our sample could be inferred from the successive measurement of a series of μ-PL spectra of QD1 directly after the pre-illumination of the sample has been switched off. Indeed, I QD showed a gradual decrease within the first 10 s, but was after that stabilized at this lower IQD. Such an evolution of I QD in real time (of the order of several s) is the signature of fluctuating local electric fields25 produced by ionized impurities in the close vicinity of QDs
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25 produced by ionized impurities in the close vicinity of QDs.
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34
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33846893460
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QD is related to IQD by performing summation over all individual QDs that are located within the area of the laser spot.
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QD is related to IQD by performing summation over all individual QDs that are located within the area of the laser spot.
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35
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33846870375
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The electric field was computed by solving Maxwell's equations by commercial software relying on methods of finite elements.
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The electric field was computed by solving Maxwell's equations by commercial software relying on methods of finite elements.
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