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5
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0005580628
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7
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21544456851
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Note
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In general, for the present device long (>1 mm) cavities exhibit ground state lasing. The excited state lasing observed for the device studied in this letter most likely results from nonoptimum facet mirrors.
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8
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21544449041
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Note
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TH for this device results from the short cavity length.
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9
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0020153819
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T.-P. Lee, C. A. Burrus, J. A. Copeland, A. G. Dentai, and D. Marcuse, IEEE J. Quantum Electron. 18, 1101 (1982).
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10
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21544455734
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Note
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This model assumes that the laser behaves as an amplifier of spontaneous emission and hence the gain approaches but never quite equals the cavity loss.
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13
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0038472450
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Related lasing spectra with groups of longitudinal modes separated by nonlasing gaps have been reported by
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Related lasing spectra with groups of longitudinal modes separated by nonlasing gaps have been reported by S. V. Zaitsev, N. Y. Gordeev, V. M. Ustinov, A. E. Zhukov, A. Y. Egorov, M. V. Maksimov, A. F. Tsatsul'nikov, N. N. Ledentsov, P. S. Kop'ev, Z. I. Alferov, and D. Bimberg, Semiconductors 31, 455 (1997).
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Zaitsev, S.V.1
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Egorov, A.Y.5
Maksimov, M.V.6
Tsatsul'nikov, A.F.7
Ledentsov, N.N.8
Kop'ev, P.S.9
Alferov, Z.I.10
Bimberg, D.11
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14
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0031108828
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The influence of an inhomogeneously broadened gain spectrum on the spectral emission of a quantum dot laser has been briefly discussed in
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The influence of an inhomogeneously broadened gain spectrum on the spectral emission of a quantum dot laser has been briefly discussed in D. Bimberg, N. Kirkstaedter, N. N. Ledentsov, Z. I. Alferov, P. S. Kop'ev, and V. M. Ustinov, IEEE J. Sel. Top. Quantum Electron. 3, 196 (1997).
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Bimberg, D.1
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Kop'ev, P.S.5
Ustinov, V.M.6
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16
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0000956647
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N. N. Ledentsov, N. Kirstaedter, M. Grundmann, D. Bimberg, V. M. Ustinov, I. V. Kochnev, P. S. Kop'ev, and Z. I. Alferov, Microelectron. J. 28, 915 (1997).
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Ledentsov, N.N.1
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Grundmann, M.3
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Ustinov, V.M.5
Kochnev, I.V.6
Kop'ev, P.S.7
Alferov, Z.I.8
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17
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0001641998
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B. Ohnesorge, M. Albrecht, J. Oshinowo, A. Forchel, and Y. Arakawa, Phys. Rev. B 54, 11532 (1996).
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Ohnesorge, B.1
Albrecht, M.2
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Forchel, A.4
Arakawa, Y.5
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18
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21544449350
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Note
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This large number for relatively narrow cavities results from the large refractive index contrast between the semiconductor active region and the SiN which covers the ridge.
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