Energy dispersive x-ray reflectometry as a unique laboratory tool for investigating morphological properties of layered systems and devices

Journal of Physics D: Applied Physics

Volumn 39, Issue 23, 2006, Pages

  Rossi Albertini, V ^a   Paci, B ^a   Generosi, A ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; MORPHOLOGY; REFLECTOMETERS; SURFACE ROUGHNESS; THIN FILMS;

DATA COLLECTION; ENERGY SENSITIVE DETECTORS; POLYCHROMATIC BEAMS;

ENERGY DISPERSIVE SPECTROSCOPY;

EID: 33846862032     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/39/23/R01     Document Type: Review

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