Energy dispersive X-ray reflectivity to study phase transitions in thin films

Radiation Physics and Chemistry

Volumn 70, Issue 4-5, 2004, Pages 611-617

  Bhattacharya, M ^a   Mukhopadhyay, M K ^a   Pal, S ^a   Sanyal, M K ^a  

^a SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

Author keywords

Angle dispersive X ray reflectivity; Energy dispersive X ray reflectivity; Langmuir Blodgett film; Melting; Polymer film; Thermal expansion

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; ENERGY DISPERSIVE SPECTROSCOPY; NANOSTRUCTURED MATERIALS; OPTICAL RESOLVING POWER; PHASE TRANSITIONS; SYNCHROTRON RADIATION; THERMODYNAMIC PROPERTIES; THIN FILMS; X RAYS;

ANGLE DISPERSIVE REFLECTIVITY TECHNIQUE; ENERGY DISPERSIVE X-RAY REFLECTIVITY (EDR) TECHNIQUE; NANO-STRUCTURED THIN FILMS;

RADIATION CHEMISTRY;

CONFERENCE PAPER; FILM; PHASE TRANSITION; SYNCHROTRON; X RAY;

EID: 1842861766     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radphyschem.2003.12.031     Document Type: Conference Paper

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