Structural and Morphological Characterization by Energy Dispersive X-ray Diffractometry and Reflectometry Measurements of Cr/Pt Bilayer Films

Chemistry of Materials

Volumn 16, Issue 2, 2004, Pages 292-298

  Paci, Barbara ^a   Generosi, Amanda ^a   Albertini, Valerio Rossi ^a   Agostinelli, Elisabetta ^a   Varvaro, Gaspare ^a   Fiorani, Dino ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; CRYSTAL STRUCTURE; CRYSTALLIZATION; ENERGY DISPERSIVE SPECTROSCOPY; MAGNETIC DISK STORAGE; MAGNETIC RECORDING; PULSED LASER DEPOSITION; TEXTURES;

CRYSTALLINE SUBSTRATES;

THIN FILMS;

CHROMIUM; MAGNESIUM OXIDE; PLATINUM; SILICON DIOXIDE;

ARTICLE; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; ENERGY; FILM; LASER; MORPHOLOGICAL TRAIT; REFLECTOMETRY; STRUCTURE ANALYSIS; SURFACE PROPERTY; TEMPERATURE; X RAY DIFFRACTION;

EID: 1642582231     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm031100h     Document Type: Article

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