In situ energy-dispersive X-ray reflectivity measurements of structural changes in thin films for organic electroluminescent devices

Synthetic Metals

Volumn 91, Issue 1-3, 1997, Pages 155-158

  Orita, Kenji ^a   Morimura, Takashi ^a   Horiuchi, Toshihisa ^a   Matsushige, Kazumi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Electroluminescence; Energy dispersive grazing incident X ray reflectivity; Organic devices; Thin films

Indexed keywords

ALUMINUM COMPOUNDS; ANNEALING; GLASS TRANSITION; LIGHT MEASUREMENT; METALLIC FILMS; MULTILAYERS; SILICON WAFERS; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS; X RAYS;

ENERGY DISPERSIVE GRAZING INCIDENT X RAY REFLECTIVITY (ED GIXR); SOLID STATE X RAY DETECTORS (SSD);

LUMINESCENT DEVICES;

EID: 0031334914     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0379-6779(98)80078-7     Document Type: Article

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