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Volumn , Issue 7, 1998, Pages 829-830

X-Ray reflection studies on the monolayer-mediated growth of mesostructured MCM-41 silica at the air/water interface

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EID: 21844447106 PISSN: 13597345 EISSN: None Source Type: Journal
DOI: 10.1039/a800777b Document Type: Article

Times cited : (25)

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