Image plate X-ray diffraction and X-ray reflectivity characterization of protective coatings and thin films

Thin Solid Films

Volumn 377-378, Issue , 2000, Pages 447-454

  Lee, S L ^a   Windover, D ^a,b   Doxbeck, M ^a   Nielsen, M ^b   Kumar, A ^b   Lu, T M ^b  

^a Benet Laboratories   (United States)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUSTENITE; CHROMIUM; ELECTROMAGNETIC WAVE REFLECTION; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; MARTENSITE; TANTALUM; TANTALUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

DIGITAL FILMS;

PROTECTIVE COATINGS;

EID: 0034516699     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01366-3     Document Type: Article

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