Structural, morphological and magnetic study of CoPt/Cr/MgO films by energy dispersive X-ray diffractometry and reflectometry measurements

Journal of Magnetism and Magnetic Materials

Volumn 272-276, Issue SUPPL. 1, 2004, Pages

  Paci, B ^a   Generosi, A ^a   Albertini, V Rossi ^a   Agostinelli, E ^a   Varvaro, G ^a  

^a CNR   (Italy)

Author keywords

CoPt Cr thin film; Energy dispersive X ray technique; Laser ablation; Structural and magnetic propertie

Indexed keywords

CHROMIUM; COBALT COMPOUNDS; ENERGY DISPERSIVE SPECTROSCOPY; EXCIMER LASERS; LASER ABLATION; MAGNESIA; MAGNETIC ANISOTROPY; MAGNETIC PROPERTIES; MORPHOLOGY; PULSED LASER DEPOSITION; REFLECTOMETERS; SQUIDS; X RAY DIFFRACTION ANALYSIS;

COPT/CR THIN FILMS; ENERGY DISPERSIVE X-RAY TECHNIQUE; STRUCTURAL AND MAGNETIC PROPERTIES; STRUCTURAL TEMPLATES;

THIN FILMS;

EID: 15044362009     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2003.12.1366     Document Type: Conference Paper

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