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Volumn 60, Issue 6, 1996, Pages 859-869

Orientation contrast imaging of microstructures in rocks using forescatter detectors in the scanning electron microscope

Author keywords

Backscattered electrons; Contrast images; Scanning electron microscopy

Indexed keywords

ATOMS; BACKSCATTERING; ELECTRON SCATTERING; ELECTRONS; GEOMETRY; MICROSTRUCTURE;

EID: 0030441094     PISSN: 0026461X     EISSN: None     Source Type: Journal    
DOI: 10.1180/minmag.1996.060.403.01     Document Type: Article
Times cited : (173)

References (48)
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    • Joy, D.C. (1974) In Quantitative Scanning Electron Microscopy (D.B. Holt, M.D. Muir, I.M. Boswarva and P.R. Grant, eds). Academic Press, New York.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.