An experimentally convenient configuration for electron channeling contrast imaging

Ultramicroscopy

Volumn 77, Issue 1-2, 1999, Pages 65-75

  Simkin, B A ^a   Crimp, M A ^a  

^a MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; DISLOCATIONS (CRYSTALS); ELECTRON BEAMS; ELECTRON SCATTERING; IMAGING TECHNIQUES; PARTICLE DETECTORS;

BRAGG CHANNELING; ELECTRON CHANNELING CONTRAST IMAGING (ECCI);

ELECTRON MICROSCOPY;

ARTICLE; CONTRAST ENHANCEMENT; CONTROLLED STUDY; DISLOCATION; ELECTRON; ELECTRON MICROSCOPY; TILTING;

EID: 0032962215     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00009-1     Document Type: Article

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