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Applied Physics Letters

Volumn 83, Issue 23, 2003, Pages 4797-4799

Plan-view image contrast of dislocations in GaN

(5) Follstaedt, D M a Missert, N A a Koleske, D D a Mitchell, C C a Cross, K C a

a SANDIA NATIONAL LABORATORIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON HOLE RECOMBINATION; ION MILLING; LATTICE SPACING;

ATOMIC FORCE MICROSCOPY; CATHODOLUMINESCENCE; CRYSTAL LATTICES; CRYSTAL ORIENTATION; DIFFRACTION; DISLOCATIONS (CRYSTALS); ELECTRON ENERGY LEVELS; IMAGING TECHNIQUES; METALLORGANIC VAPOR PHASE EPITAXY; RELAXATION PROCESSES; SURFACE PHENOMENA; TRANSMISSION ELECTRON MICROSCOPY;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0348197044 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1632540 Document Type: Article

Times cited : (64)

References (18)

1
- 0033344436
- J. S. Speck and S. J. Rosner, Physica B 273-274, 24 (1999).
- (1999) Physica B , vol.273-274 , pp. 24
- Speck, J.S.¹ Rosner, S.J.²

2
- 0031588273
- T. S. Zheleva, O.-H. Nam, M. D. Bremser, and R. F. Davis, Appl. Phys. Lett. 71, 2472 (1997).
- (1997) Appl. Phys. Lett. , vol.71 , pp. 2472
- Zheleva, T.S.¹ Nam, O.-H.² Bremser, M.D.³ Davis, R.F.⁴

3
- 0001551505
- D. Kapolnek, S. Keller, R. Vetury, R. D. Underwood, P. Kozodoy, S. P. DenBaars, and U. K. Mishra, Appl. Phys. Lett. 71, 1204 (1997).
- (1997) Appl. Phys. Lett. , vol.71 , pp. 1204
- Kapolnek, D.¹ Keller, S.² Vetury, R.³ Underwood, R.D.⁴ Kozodoy, P.⁵ Denbaars, S.P.⁶ Mishra, U.K.⁷

4
- 0034497117
- K. Hiramatsu, K. Nishiyama, M. Onishi, H. Mizutani, M. Narukawa, A. Motogaito, H. Miyake, Y. Iyechika, and T. Maeda, J. Cryst. Growth 221, 316 (2000).
- (2000) J. Cryst. Growth , vol.221 , pp. 316
- Hiramatsu, K.¹ Nishiyama, K.² Onishi, M.³ Mizutani, H.⁴ Narukawa, M.⁵ Motogaito, A.⁶ Miyake, H.⁷ Iyechika, Y.⁸ Maeda, T.⁹

5
- 0032620385
- K. Linthicum, T. Gehrke, D. Thomson, E. Carlson, P. Rajagopal, T. Smith, D. Batchelor, and R. Davis, Appl. Phys. Lett. 75, 196 (1999).
- (1999) Appl. Phys. Lett. , vol.75 , pp. 196
- Linthicum, K.¹ Gehrke, T.² Thomson, D.³ Carlson, E.⁴ Rajagopal, P.⁵ Smith, T.⁶ Batchelor, D.⁷ Davis, R.⁸

6
- 0001236278
- C. I. H. Ashby, C. C. Mitchell, J. Han, N. A. Missert, P. P. Provencio, D. M. Follstaedt, G. M. Peake, and L. Griego, Appl. Phys. Lett. 77, 3233 (2000).
- (2000) Appl. Phys. Lett. , vol.77 , pp. 3233
- Ashby, C.I.H.¹ Mitchell, C.C.² Han, J.³ Missert, N.A.⁴ Provencio, P.P.⁵ Follstaedt, D.M.⁶ Peake, G.M.⁷ Griego, L.⁸

7
- 0347220994
- K. Tadatomo. H. Okagawa, Y. Ohuchi, T. Tsunekawa, T. Jyouichi, Y. Imada, M. Kalo, H. Kudo, and T. Taguchi, Phys. Status Solidi A 188, 121 (2001).
- (2001) Phys. Status Solidi A , vol.188 , pp. 121
- Tadatomo, K.¹ Okagawa, H.² Ohuchi, Y.³ Tsunekawa, T.⁴ Jyouichi, T.⁵ Imada, Y.⁶ Kalo, M.⁷ Kudo, H.⁸ Taguchi, T.⁹

8
- 0035876466
- H. Morkoc, Mater. Sci. Eng., R. 33, 135 (2001).
- (2001) Mater. Sci. Eng., R. , vol.33 , pp. 135
- Morkoc, H.¹

9
- 79955993717
- D. D. Koleske, A. J. Fischer, A. A. Allerman, C. C. Mitchell, S. R. Kurtz, J. J. Figiel, K. W. Fullmer, and W. G. Breiland. Appl. Phys. Lett. 81, 1940 (2002).
- (2002) Appl. Phys. Lett. , vol.81 , pp. 1940
- Koleske, D.D.¹ Fischer, A.J.² Allerman, A.A.³ Mitchell, C.C.⁴ Kurtz, S.R.⁵ Figiel, J.J.⁶ Fullmer, K.W.⁷ Breiland, W.G.⁸

10
- 0029637531
- S. D. Lester, F. A. Ponce, M. G. Craford, and D. A. Steigerwald, Appl. Phys. Lett. 66, 1249 (1995).
- (1995) Appl. Phys. Lett. , vol.66 , pp. 1249
- Lester, S.D.¹ Ponce, F.A.² Craford, M.G.³ Steigerwald, D.A.⁴

11
- 79956029123
- D. M. Follstaedt, P. P. Provencio, N. A. Missert, C. C. Mitchell, D. D. Koleske, A. A. Allerman, and C. I. H. Ashby, Appl. Phys. Lett. 81, 2758 (2002).
- (2002) Appl. Phys. Lett. , vol.81 , pp. 2758
- Follstaedt, D.M.¹ Provencio, P.P.² Missert, N.A.³ Mitchell, C.C.⁴ Koleske, D.D.⁵ Allerman, A.A.⁶ Ashby, C.I.H.⁷

12
- 0347851088
- K. Motoki, T. Okahisa, S. Nakahata, N. Matsumoto, H. Kimura, H. Kasai, K. Takemoto, K. Uematsu, M. Ueno, Y. Kumagai, A. Koukitu, and H. Seki, Mater. Sci. Eng., B 93, 1123 (2002).
- (2002) Mater. Sci. Eng., B , vol.93 , pp. 1123
- Motoki, K.¹ Okahisa, T.² Nakahata, S.³ Matsumoto, N.⁴ Kimura, H.⁵ Kasai, H.⁶ Takemoto, K.⁷ Uematsu, K.⁸ Ueno, M.⁹ Kumagai, Y.¹⁰ Koukitu, A.¹¹ Seki, H.¹²

13
- 0347851087
- Krieger, Huntington, NY; Sec. 7.5.4, pp. 169-188, and Sec. 11.7
- P. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals 2nd revised ed. (Krieger, Huntington, NY, 1977); Sec. 7.5.4, pp. 169-188, and Sec. 11.7, pp. 272-275.
- (1977) Electron Microscopy of Thin Crystals 2nd Revised Ed. , pp. 272-275
- Hirsch, P.¹ Howie, A.² Nicholson, R.B.³ Pashley, D.W.⁴ Whelan, M.J.⁵

14
- 0042925387
- M. P. Moran, A. K. Norman, and D. M. Follstaedt, Microsc. Microanal. 9, Suppl. 2, 106 (2003).
- (2003) Microsc. Microanal. , vol.9 , Issue.SUPPL. 2 , pp. 106
- Moran, M.P.¹ Norman, A.K.² Follstaedt, D.M.³

15
- 84874102108
- W. J. Tunstall, P. B. Hirsch, and J. Steeds, Philos. Mag. 9, 99 (1964).
- (1964) Philos. Mag. , vol.9 , pp. 99
- Tunstall, W.J.¹ Hirsch, P.B.² Steeds, J.³

16
- 0001132782
- W. Qian, G. S. Rohrer, M. Skowronski, K. Doverspike, L. B. Rowland, and D. K. Gaskill, Appl. Phys. Lett. 67, 2284 (1995).
- (1995) Appl. Phys. Lett. , vol.67 , pp. 2284
- Qian, W.¹ Rohrer, G.S.² Skowronski, M.³ Doverspike, K.⁴ Rowland, L.B.⁵ Gaskill, D.K.⁶

17
- 85042807979
- T. Sugahara, H. Sato, M. Hao, Y. Naoi, S. Kurai, S. Tottori, K. Yamashita, K. Nishino, L. T. Romano, and S. Sakai, Jpn. J. Appl. Phys. 37, L398 (1998).
- (1998) Jpn. J. Appl. Phys. , vol.37
- Sugahara, T.¹ Sato, H.² Hao, M.³ Naoi, Y.⁴ Kurai, S.⁵ Tottori, S.⁶ Yamashita, K.⁷ Nishino, K.⁸ Romano, L.T.⁹ Sakai, S.¹⁰

18
- 0035971881
- D. Chems, S. J. Henley, and F. A. Ponce, Appl. Phys. Lett. 78, 2691 (2001).
- (2001) Appl. Phys. Lett. , vol.78 , pp. 2691
- Chems, D.¹ Henley, S.J.² Ponce, F.A.³

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