Simple calculations of proton SEU cross sections from heavy ion cross sections

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3336-3342

  Barak, J ^a,b  

^a IEEE   (Israel)

^b SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

Indirect LET of protons; Proton induced SEU; SEU rates in space

Indexed keywords

PROTON INDUCTION; SEU;

PROTON IRRADIATION; PROTONS; SILICON;

HEAVY IONS;

EID: 33846333834     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.883851     Document Type: Conference Paper

References (32)

1. J. Barak, "Analytical microdosimetry model for proton-induced SEU in modem devices," IEEE Trans. Nucl. Sci., vol. 48, pp. 1937-1945, Dec. 2001.
2. G. C. Messenger and M. S. Ash, Single Event Phenomena. London, U.K.: Chapman & Hall, 1997.
3. E. Normand, "Extension of the burst generation rate method for wider application to proton/neutron-induced single event effects," IEEE Trans. Nucl. Sci., vol. 45, pp. 2904-2914, Dec. 1998.
4. M. B. Chadwick and E. Normand, "Use of new ENDF/B-VI proton and neutron cross section for single event upset calculations," IEEE Trans. Nucl. Sci., vol. 46, pp. 1386-1394, Dec. 1999.
5. A. Akkerman, Y. Lifshitz, J. Levinson, M. Hass, and D. Ilberg, "A practical model for calculation of the proton induced SEU cross section using experimental heavy ion SEU cross sections," in Proc. RADECS 1991, La Grande-Motte, France, Sep. 9-12, 1991, pp. 509-513.
6. A. Akkerman, J. Barak, J. Levinson, and Y. Lifshitz, "Modeling of proton induced SEUs," Rod. Phys. Chem., vol. 48, pp. 11-22, 1996.
7. J. Barak, J. Levinson, A. Akkerman, Y. Lifshitz, and M. Victoria, "A simple model for calculating proton induced SEU," IEEE Trans. Nucl. Sci., vol. 43, pp. 979-984, Jun. 1996.
8. J. Barak, "Empirical modeling of proton induced SEU rates," IEEE Trans. Nucl. Sci., vol. 47, pp. 545-550, Jun. 2000.
9. B. Doucin, T. Carrière, C. Poivey, P. Garnier, J. Beaucour, and Y. Patin, "Model of single event upsets induced by space protons in electronic devices," in Proc. RADECS 1995, Arcachon, France, Sep. 18-22, 1995, pp. 402-408.
10. Nuclear Data for Neutron and Proton Radiotherapy and for Radiation Protection (in Int. Commission on Radiation Units and Measurements) Bethesda, MD, ICRU 63 Rep., 2000.
11. J. Barak, A. Haran, E. Adler, A. Azoulay, J. Levinson, A. Zentner, D. David, B. E. Fischer, M. Heiss, and D. Betel, "Use of light-ion-induced SEU in devices under reduced bias to evaluate their SEU cross section," IEEE Trans. Nucl. Sci., vol. 51, pp. 3486-3493, Dec. 2004.
12. A. Akkerman, J. Barak, and Y. Lifshitz, "Nuclear models for proton induced upsets: A critical comparison," IEEE Trans. Nucl. Sci., vol. 49, pp. 1539-1546, Jun. 2002.
13. C. Weulersse, G. Hubert, G. Forget, N. Buard, T. Carrière, P. Heins, J. M. Palau, F. Saigné, and R. Gaillad, "DASIE analytical version: A predictive tool for neutrons, protons and heavy ions induced SEU cross section," IEEE Trans. Nucl. Sci., vol. 53, no. 4, pp. 1876-1882, Aug. 2006.
14. J. F. Ziegler, "SRIM-2003," Nucl. Instrum. Methods Phys. Res. B vol. 219-220, pp. 1027-1036, 2004 [Online]. Available: http://www.srim. org.
15. E. L. Petersen, "The SEU figure of merit and proton upset rate calculations," IEEE Trans. Nucl. Sci., vol. 45, pp. 2550-2562, Dec. 1998.
16. J. Barak, R. Reed, and K. A. LaBel, "On the figure of merit model for SEU rate calculations," IEEE Trans. Nucl. Sci., vol. 46, pp. 1504-1510, Dec. 1999.
17. L. D. Edmonds, "Proton SEU cross sections derived from heavy-ion test data," IEEE Trans. Nucl. Sci., vol. 47, pp. 1713-1728, Oct. 2000.
18. P. Calvel, C. Barillot, P. Lamothe, R. Ecoffet, S. Duzellier, and D. Falguère, "An empirical model for predicting proton induced upset," IEEE Trans. Nucl. Sci., vol. 43, pp. 2827-2832, Dec. 1996.
19. [Online]. Available: https://creme96.nrl.navy.mil/
20. J. Barak, J. L. Earth, C. M. Seidleck, C. J. Marshall, P. W. Marshall, M. A. Carts, and R. A. Reed, "Single event upsets in the Dual-Port-Board SRAMs of the MPTB experiment," IEEE Trans. Nucl. Sci., vol. 47, pp. 712-717, Jun. 2000.
21. R. Koga, J. George, G. Swift, C. Yui, L. Edmonds, C. Carmichael, T. Langley, P. Murray, K. Lanes, and M. Napir, "Comparison of Xilinx Virtex-II FPGA SEE sensitivities to protons and heavy ions," IEEE Trans. Nucl. Sci., vol. 51, pp. 2825-2833, Oct. 2004.
22. M. J. Gadlage, P. H. Eaton, J. M. Benedetto, and T. L. Turflinger, "Comparison of heavy ion and proton induced combinatorial and sequential logic error rates in a deep submicron process," IEEE Trans. Nucl. Sci., vol. 52, pp. 2120-2124, Dec. 2005.
23. Y. Kimoto, N. Nemoto, H. Matsumoto, K.-i. Ueno, T. Goka, and T. Omodaka, "Space radiation environment and its effects on satellites: Analysis of the first data from TEDA on board ADEOS-II," IEEE Trans. Nucl. Sci., vol. 52, pp. 1574-1578, Oct. 2005.
24. F. Irom, F. F. Farmanesh, A. H. Johnston, G. M. Swift, and D. G. Millward, "Single-event upset in commercial silicon-on-insulator PowerPC microprocessors," IEEE Trans. Nucl. Sci., vol. 49, pp. 3148-3155, Dec. 2002.
25. J. Levinson, A. Akkerman, M. Victoria, M. Hass, D. Ilberg, M. Alurralde, R. Henneck, and Y. Lifshitz, "New insight into proton-induced latchup: Experiment and modeling," Appl. Phys. Lett., vol. 63, pp. 2952-2954, 1993.
26. R. Koga, P. Yu, K. Crawford, S. Crain, and V. Tran, "Comparison of heavy ion and proton-induced single event effects (SEE) sensitivities," IEEE Trans. Nucl. Sci., vol. 49, pp. 3135-3141, Dec. 2002.
27. J. Barak, J. Levinson, A. Akkerman, E. Adler, A. Zentner, D. David, Y. Lifshitz, M. Hass, B. E. Fischer, M. Schlögl, M. Victoria, and W. Hajdas, "Scaling of SEU mapping and cross section, and proton induced SEU at reduced supply voltage," IEEE Trans. Nucl. Sci., vol. 46, pp. 1342-1353, Dec. 1999.
28. A. Akkerman, J. Barak, J. Levinson, and Y. Lifshitz, "The effect of the angle of incidence on proton induced single events in devices - a critical assessment by modeling," IEEE Trans. Nucl. Sci., vol. 45, pp. 1617-1623, Jun. 1998.
29. C. L. Howe, R. A. Weller, R. A. Reed, M. H. Mendenhall, R. D. Schrimpf, K. M. Warren, D. R. Ball, L. W. Massengill, K. A. LaBel, J. W. Howard, Jr., and N. F. Haddad, "Role of heavy-ion nuclear reactions in determining on-orbit single event error rates," IEEE Trans. Nucl. Sci., vol. 52, pp. 2182-2188, Dec. 2005.
30. J. R. Schwank, M. R. Shaneyfelt, J. Baggio, P. E. Dodd, J. A. Felix, V. Ferlet-Cavrois, P. Paillet, D. Lambert, F. W. Sexton, G. L. Hash, and E. Blackmore, "Effects of particle energy on proton-induced single-event latchup," IEEE Trans. Nucl. Sci., vol. 52, pp. 2622-2629, Dec. 2005.
31. A. Akkerman, J. Barak, and D. Emfietzoglou, "Ion and electron trackstructure and its effects in silicon: Model and calculations," Nucl. Instrum. Methods Phys. Res. B., vol. B227, pp. 319-336, 2005.
32. J. Barak and A. Akkerman, "Straggling and extreme cases in the energy deposition by ions in sub-micron silicon volumes," IEEE Trans. Nucl. Sci., vol. 52, pp. 2175-2181, Dec. 2005.