Use of light-ion-induced SEU in devices under reduced bias to evaluate their SEU cross section

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 II, 2004, Pages 3486-3493

  Barak, J ^a   Haran, A ^a   Adler, E ^a   Azoulay, M ^a   Levinson, J ^a   Zentner, A ^a   David, D ^a   Fischer, B E ^b   Heiss, M ^b   Betel, D ^c  

^a SOREQ NUCLEAR RESEARCH CENTER   (Israel)

^b GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^c Tower Semiconductor ^*  (Israel)

Author keywords

particles SEU; Light ions; Reduced bias SEU

Indexed keywords

CARBON; COMPUTER SIMULATION; DATA ACQUISITION; ELECTRIC POTENTIAL; ENERGY TRANSFER; POWER SUPPLY CIRCUITS; SENSITIVITY ANALYSIS;

Α-PARTICLE SEU; LIGHT IONS; OPERATION BIAS; REDUCED BIAS SEU;

IONS;

EID: 19944387603     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839171     Document Type: Conference Paper

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