Comparison of Xilinx Virtex-II FPGA SEE sensitivities to protons and heavy ions

IEEE Transactions on Nuclear Science

Volumn 51, Issue 5 III, 2004, Pages 2825-2833

  Koga, R ^a   George, J ^a   Swift, G ^b   Yui, C ^b   Edmonds, L ^b   Carmichael, C ^c   Langley, T ^d   Murray, P ^d   Lanes, K ^e   Napier, M ^e  

^a AEROSPACE CORPORATION   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c XILINX INC   (United States)

^d SEAKR ENGINEERING INC   (United States)

^e SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Field programmable gate array (FPGA); Heavy ion radiation effects; Proton radiation effects; Semiconductor device testing; Single event effects

Indexed keywords

FIELD PROGRAMMABLE GATE ARRAYS; NEUTRON SCATTERING; PROTONS; RADIATION EFFECTS; SEMICONDUCTOR DEVICE TESTING; SHIFT REGISTERS;

ELASTIC NUCLEAR SCATTERING; HEAVY ION RADIATION EFFECTS; PROTON RADIATION EFFECTS; SINGLE EVENT EFFECTS;

HEAVY IONS;

EID: 8344252949     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.835057     Document Type: Article

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